Skip to main content
Article
X-ray Scattering Studies of Two Length Scales in the Critical Fluctuations of CuGeO3
Science
  • Y. J. Wang, Massachusetts Institute of Technology
  • Y. J. Kim, Massachusetts Institute of Technology
  • Rebecca J. Christianson, Olin College of Engineering
  • S. C. LaMarra, Massachusetts Institute of Technology
  • F. C. Chou, Massachusetts Institute of Technology
  • R. J. Birgeneau, Massachusetts Institute of Technology
Document Type
Article
Publication Date
1-5-2001
Disciplines
Abstract

The critical fluctuations of CuGeO3 have been measured by synchrotron x-ray scattering, and two length scales are clearly observed. The ratio between the two length scales is found to be significantly different along the a axis, with the a axis along the surface normal direction. We believe that such a directional preference is a clear sign that random surface strains, especially those caused by dislocations, are the origin of the long length scale fluctuations.

Comments

© (2001) American Physical Society. The article appeared in Physical Review B, Vol 63, and may be found at http://prb.aps.org/abstract/PRB/v63/i5/e052502.

Citation Information
Y. J. Wang, Y. J. Kim, Rebecca J. Christianson, S. C. LaMarra, et al.. "X-ray Scattering Studies of Two Length Scales in the Critical Fluctuations of CuGeO3" (2001)
Available at: http://works.bepress.com/rebecca_christianson/7/