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Article
A configurable assessment information system.
USF St. Petersburg campus Faculty Publications
  • Art Gowan
  • Bryan MacDonald
  • Han Reichgelt
SelectedWorks Author Profiles:

Han Reichgelt

Document Type
Article
Publication Date
2006
Disciplines
ISBN
1-59593-521-5
Abstract

There has been a shift in accreditation away from an input-based approach to an outcome-based approach. In order to be accredited, programs and/or institutions no longer have to meet a long checklist of requirements concerning faculty, curriculum, facilities and so on. Instead, programs or institutions must demonstrate that they have formulated a set of attributes that they want graduates to possess at the time of graduation, and that they have a process in place to assess the extent to which they are successful in enabling graduates to achieve these attributes and to use the results of this assessment for program improvement. Many programs and institutions experienced difficulties in setting up an adequate assessment and continuous improvement process. This paper describes a configurable assessment information system that helps institutions and programs set up an assessment process and record the results of this process.

Comments
Citation only. Full-text article is available through licensed access provided by the publisher. Published in SIGITE '06 Proceedings of the 7th conference on Information technology education, Minneapolis, MN, October 2006. (pp. 77-81). New York: Association for Computing Machinery. doi: 10.1145/1168812.1168833. Members of the USF System may access the full-text of the article through the authenticated link provided.
Language
en_US
Publisher
Association for Computing Machinery
Creative Commons License
Creative Commons Attribution-Noncommercial-No Derivative Works 4.0
Citation Information
Gowan, A., MacDonald, B., & Reichgelt, H. (2006). A configurable assessment information system. SIGITE '06 Proceedings of the 7th conference on Information technology education, Minneapolis, MN, October 2006. (pp. 77-81). New York: Association for Computing Machinery. doi: 10.1145/1168812.1168833