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Predicted Static Fatigue (delayed fracture) Lifetime of a Fiber-optic Test Specimen: Application of Analytical Modeling Technique
Optical Components and Materials XV
  • Ephraim Suhir, Portland State University
  • Sung Yi, Portland State University
Document Type
Citation
Publication Date
2-1-2018
Abstract

The recently suggested probabilistic design-for-reliability (PDfR) concept, and particularly its physically meaningful and flexible analytical Boltzmann-Arrhenius-Zhurkov (BAZ) model, can be effectively employed as an attractive replacement of the widely used today purely empirical and physically unsubstantiated power law relationship for assessing/predicting the static fatigue (delayed fracture) lifetime of optical silica fibers. The BAZ model can be used to estimate the static fatigue lifetime of a coated optical silica “specialty” fiber intended for high temperature applications and subjected to the combined action of tensile loading and an elevated temperature. BAZ relationship is one of the possible predictive models of the recently suggested probabilistic design for reliability (PDfR) concept. This concept has its experimental basis in the highly-focused and highly-cost-effective failure-oriented accelerated testing (FOAT). Such testing is absolutely crucial, if one intends to understand the underlying reliability physics. It is shown how the PDfR concept, BAZ model and FOAT data can be employed, when there is a need to assess the expected static fatigue lifetime of a coated optical fiber subjected to the combined action of the tensile loading and elevated temperature. The general concept is illustrated by a practical example. The approach could be easily extended for any type of optical fibers, including laser fibers, or even to other types of accelerated testing of optical materials, fibers and devices.

Description

Proceedings Paper

Persistent Identifier
https://archives.pdx.edu/ds/psu/27810
Citation Information
E. Suhir and S. Yi "Predicted static fatigue (delayed fracture) lifetime of a fiber optic test specimen: application of analytical modeling technique", Proc. SPIE 10528, Optical Components and Materials XV, 105280W (22 February 2018); doi: 10.1117/12.2280650; https://doi.org/10.1117/12.2280650