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Faculty Selected Works of Zhi Xu
Article
Birefringence Dispersion Measured by Low-coherence Spectral Interferometry Using a Spectrophotometer
Applied Industrial Optics: Spectroscopy, Imaging and Metrology (2012)
  • Zhigang Han, Nanjing University of Science and Technology
  • Lei Chen, Nanjing University of Science and Technology
  • Zhi Xu, University of Missouri–St. Louis
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Abstract
Transmittance spectral interferograms were obtained to understand the birefringence dispersion of quartz crystal. The interferograms have uniform background and modulation and were taken with 0.5 nm spectral resolution.
Disciplines
Publication Date
January 1, 2012
DOI
10.1364/AIO.2012.JTu5A.11
Citation Information
Zhigang Han, Lei Chen and Zhi Xu. "Birefringence Dispersion Measured by Low-coherence Spectral Interferometry Using a Spectrophotometer" Applied Industrial Optics: Spectroscopy, Imaging and Metrology (2012)
Available at: http://works.bepress.com/zhi-xu/5/