Understanding the accumulation and dynamics of embedded charge in insulating materials is paramount for myriad of applications from HVDC power transmission to spacecraft charging. 

PEA systems allow for nondestructive measurements of embedded charge distributions. The spatial resolution of PEA measurements are typically defined as the FWHM of the leading interfacial peak, ~10 µm is typical. However, this is only one moment of the charge distribution. There are also the magnitude, peak position, and skewness of the charge distribution. 

Precise knowledge of the peak position of embedded charge distributions is important for understanding the electrical properties of insulators such as conductivity (slow charge migration), radiation induced conductivity (and delayed radiation induced conductivity), and electron range/penetration depth (as a function of dose and incident energy). 

This study focuses on the resolution of the peak position of embedded charge distributions measured via the PEA method.