Understanding and predicting charge accumulation and transport in dielectric materials is vital in applications where excess charge can accumulate including semiconductor devices, high-power electronic devices, high voltage DC cabling, high-energy physics facilities, plasma chambers, and spacecraft charging. Excess charge accumulation may result in electrostatic discharge events, which are the leading cause of spacecraft failure due to the space environment. The pulsed electroacoustic method allows you to “pop the hood” and non-destructively directly measure the embedded charge distributions in dielectric materials. Charge transport in disordered dielectric materials, measurements with the pulsed electroacoustic system, and comparison to models will be presented.