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Article
Scanning microwave microscopy characterization of spin-spray-deposited ferrite/nonmagnetic films
Journal of Electronic Materials
  • Yun Xing, Wright State University - Main Campus
  • Joshua Myers, Wright State University - Main Campus
  • Ogheneyunume Obi
  • Nian X. Sun
  • Yan Zhuang, Wright State University - Main Campus
Document Type
Article
Publication Date
3-1-2012
Abstract
In this study, we performed single-grain-boundary characterization of ferrite films at radio and microwave frequencies using scanning microwave microscopy (SMM). The sample consisted of Fe 3O 4/ photoresist/Fe 3O 4 multilayers deposited on glass substrate at 90°C by spin-spray coating. SMM images were recorded at various resonant frequencies between 2.0 GHz and 8.0 GHz. These images showed higher electrical conductivity at grain boundaries than at the core of grains. This phenomenon can be explained by space-charge accumulation at the grain boundary. © 2011 TMS.
DOI
10.1007/s11664-011-1874-8
Citation Information
Yun Xing, Joshua Myers, Ogheneyunume Obi, Nian X. Sun, et al.. "Scanning microwave microscopy characterization of spin-spray-deposited ferrite/nonmagnetic films" Journal of Electronic Materials Vol. 41 Iss. 3 (2012) p. 530 - 534 ISSN: 03615235
Available at: http://works.bepress.com/yan_zhuang/25/