In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O3–PbTiO3Applied Physics Letters (2000)
In this letter, we report in situ transmission electron microscopy (TEM) study of effect of a cyclic electric field on microcracking in a single crystal piezoelectric 0.66Pb(Mg1/3Nb2/3)O3–0.34PbTiO3. A TEM heating stage was modified to permit the in situ application of an electric field on the TEM sample surface. Microcrack initiation from a fine pore under an applied cyclic electric field was directly observed in the piezoelectric single crystal. Experimental procedures for in situ TEM studies were described.
- Transmission electron microscopy,
- piezoelectric fields,
- single crystals,
Citation InformationZ. Xu, Xiaoli Tan, P. Han and J.K. Shang. "In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O3–PbTiO3" Applied Physics Letters Vol. 76 Iss. 25 (2000)
Available at: http://works.bepress.com/xiaoli_tan/40/