Skip to main content
Article
In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O3–PbTiO3
Applied Physics Letters (2000)
  • Z. Xu, University of Illinois at Urbana-Champaign
  • Xiaoli Tan, University of Illinois at Urbana-Champaign
  • P. Han, University of Illinois at Urbana-Champaign
  • J.K. Shang, University of Illinois at Urbana-Champaign
Abstract
In this letter, we report in situ transmission electron microscopy (TEM) study of effect of a cyclic electric field on microcracking in a single crystal piezoelectric 0.66Pb(Mg1/3Nb2/3)O3–0.34PbTiO3. A TEM heating stage was modified to permit the in situ application of an electric field on the TEM sample surface. Microcrack initiation from a fine pore under an applied cyclic electric field was directly observed in the piezoelectric single crystal. Experimental procedures for in situ TEM studies were described.
Keywords
  • Transmission electron microscopy,
  • piezoelectric fields,
  • single crystals,
  • niobium,
  • ozone
Disciplines
Publication Date
2000
Publisher Statement
The following article appeared in Applied Physics Letters 76 (2000): 3732 and may be found at http://dx.doi.org/0.1063/1.126765. Copyright 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Citation Information
Z. Xu, Xiaoli Tan, P. Han and J.K. Shang. "In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O3–PbTiO3" Applied Physics Letters Vol. 76 Iss. 25 (2000)
Available at: http://works.bepress.com/xiaoli_tan/40/