Article
Methods For Planning Accelerated Repeated Measures Degradation Tests
Statistics Preprints
Publication Date
9-1-2013
Series Number
Preprint #2013-05
Disciplines
Abstract
Accelerated repeated measures degradation tests can sometimes be used to assess product or component reliability when one would expect few or even no failures during a study. Such tests can be used to estimate the lifetime distributions of highly reliable items. This paper describes methods for selecting a single-variable accelerated repeated measures degradation test plan when the (possibly transformed) degradation is linear in (possibly transformed) time and unit-to-unit variability is described by a random effect. To find optimum test plans, we use a criterion based on a large-sample approximation to the estimation precision of the quantile of the failure-time distribution at use conditions. We also discuss how to find compromise test plans that satisfy practical constraints. We use the general equivalence theorem to verify that a test plan is globally optimum. The resulting optimized plans are also evaluated using simulation and compared with other test plans.
Language
en
Citation Information
Brian Phillip Weaver and William Q Meeker. "Methods For Planning Accelerated Repeated Measures Degradation Tests" (2013) Available at: http://works.bepress.com/wqmeeker/113/
This preprint was published as Brian P. Weaver and William Q. Meeker, "Methods for Planning Repeated Measures Accelerated Degradation Tests", Applied Stochastic Models in Business and Industry (2014): 658-671, doi: 10.1002/asmb.2061.