|2000 - Present||Professor, Boise State University ‐ Department of Materials Science and Engineering|
Honors and Awards
- 2011, 2008, 2004 - Honored Faculty Member - Boise State University Top Ten Scholar/Alumni Association
- 2009 - Elected - IEEE Senior Member
- 2007 - Professor of the Year, College of Engineering, Boise State University
- 2005-2006 - Faculty Research Associate, Office of Research Administration, Boise State University
- ENGR 245: Introduction to Materials Science and Engineering
- MSE 310/ECE 340: Electrical Properties of Materials
- ENGR 441/541: Semiconductor Materials
- ENGR 549: Special Topics In Materials Science and Engineering [Quantum Effects in MOS Devices]
- MSE 308: Thermodynamics of Materials
- 440: Introduction to IC Processing
- ENGR 120: Introduction to Engineering
- MSE 508: Solid State Thermodynamics
- MSE/ECE/MBE 497-597: Communicating Nanoscience & Nanotechnology
- MSE 510: Electrical, Optical, and Dielectric Materials
Cryogenic to Room Temperature Effects of NBTI in High-k PMOS ...
2011 IEEE International Integrated Reliability Workshop Final Report (IRW) (2011)
We present experimental evidence that trapping mechanisms contributing to the negative bias temperature instability (NBTI) of high-k dielectric p-channel metal ...
An Interactive Simulation Tool for Complex Multilayer Dielectric Devices
IEEE Transactions on Device and Materials Reliability (2011)
Novel devices incorporating multiple layers of new materials increase the complexity of device structures, particularly in field-effect transistors, capacitors, and ...
Limitations of Poole–Frenkel Conduction in Bilayer HfO2/SiO2 MOS ...
IEEE Transactions on Device and Materials Reliability (2010)
The gate leakage current of metal–oxide– semiconductors (MOSs) composed of hafnium oxide (HfO2) exhibits temperature dependence, which is usually attributed ...