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Design and performance of a curved-crystal x-ray emission spectrometer
Review of Scientific Instruments
  • A. C. Hudson, University of Nevada, Las Vegas
  • Wayne C. Stolte, University of Nevada, Las Vegas
  • Dennis W. Lindle, University of Nevada, Las Vegas
  • Renaud Guillemin, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement
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A curved-crystal x-ray emission spectrometer has been designed and built to measure 2–5 keV x-ray fluorescence resulting from a core-level excitation of gas phase species. The spectrometer can rotate 180°, allowing detection of emitted x rays with variable polarization angles, and is capable of collecting spectra over a wide energy range (20 eV wide with 0.5 eV resolution at the Cl K edge) simultaneously. In addition, the entire experimental chamber can be rotated about the incident-radiation axis by nearly 360° while maintaining vacuum, permitting measurements of angular distributions of emitted x rays.

  • Spectrometer; Reviews

DOI: 10.1063/1.2735933

Copyright American Institute of Physics, used with permission
Citation Information
A. C. Hudson, Wayne C. Stolte, Dennis W. Lindle and Renaud Guillemin. "Design and performance of a curved-crystal x-ray emission spectrometer" Review of Scientific Instruments Vol. 78 Iss. 053101 (2007) p. 6
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