Design and performance of a curved-crystal x-ray emission spectrometerReview of Scientific Instruments
AbstractA curved-crystal x-ray emission spectrometer has been designed and built to measure 2–5 keV x-ray fluorescence resulting from a core-level excitation of gas phase species. The spectrometer can rotate 180°, allowing detection of emitted x rays with variable polarization angles, and is capable of collecting spectra over a wide energy range (20 eV wide with 0.5 eV resolution at the Cl K edge) simultaneously. In addition, the entire experimental chamber can be rotated about the incident-radiation axis by nearly 360° while maintaining vacuum, permitting measurements of angular distributions of emitted x rays.
PermissionsCopyright American Institute of Physics, used with permission
Citation InformationA. C. Hudson, Wayne C. Stolte, Dennis W. Lindle and Renaud Guillemin. "Design and performance of a curved-crystal x-ray emission spectrometer" Review of Scientific Instruments Vol. 78 Iss. 053101 (2007) p. 6
Available at: http://works.bepress.com/wayne_stolte/2/