Prediction of Effective Permittivity of Diphasic Dielectrics Using an Equivalent Capacitance ModelJournal of Applied Physics
AbstractAn analytical model based on an equivalent capacitance circuit for expressing a static effective permittivity of a composite dielectric with complex-shaped inclusions is presented. The dielectric constant of 0-3 composites is investigated using this model. The geometry of the capacitor containing a composite dielectric is discretized into partial parallel-plate capacitor elements, and the effective permittivity of the composite is obtained from the equivalent capacitance of the structure. First, an individual cell diphasic dielectric (a high-permittivity spherical inclusion enclosed in a lower permittivity parallelepiped) is considered. The capacitance of this cell is modeled as a function of an inclusion radius/volume fraction. The proposed approach is extended over a periodic three-dimensional structure comprised of multiple individual cells. The results of modeling are compared with results obtained using different effective medium theories, including Maxwell Garnett, logarithmic, Bruggeman, series, and parallel mixing rules. It is found that the model predictions are in good agreement with the experimental data. The equivalent capacitance model may be applied to composites containing inclusions of any geometry and size. Although the method presented is at static electric field, it can be easily generalized for prediction of frequency-dependent effective permittivity.
Department(s)Electrical and Computer Engineering
Second DepartmentMaterials Science and Engineering
Sponsor(s)United States. Office of Naval Research
Keywords and Phrases
- Cells (Electric),
- Composite materials
Document TypeArticle - Journal
Document VersionFinal Version
Rights© 2008 American Institute of Physics (AIP), All rights reserved.
Citation InformationSandeep K. Patil, Marina Koledintseva, Robert W. Schwartz and Wayne Huebner. "Prediction of Effective Permittivity of Diphasic Dielectrics Using an Equivalent Capacitance Model" Journal of Applied Physics (2008)
Available at: http://works.bepress.com/wayne-huebner/41/