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Article
Near-Field Scan of Multiple Noncorrelated Sources using Blind Source Separation
IEEE Transactions on Electromagnetic Compatibility
  • Yuanzhuo Liu
  • Jiangshuai Li
  • Chulsoon Hwang, Missouri University of Science and Technology
  • Victor Khilkevich, Missouri University of Science and Technology
Abstract

A method for separation of the field contributions generated by multiple noncorrelated sources is proposed. The measurements are implemented using one scanning probe and one (or more) stationary reference probe, avoiding the requirement to measure the spatial correlations of the random fields. The contribution of each source can be determined with the assistance of the blind source separation technique. Averaging over realizations allows to cancel the uncorrelated part in the mixed signal measured by the scanning probe. The separated results can be used to localize the emission sources and their contribution to the field pattern. The method was tested on different signals with amplitude and frequency modulation with passive (antenna) and active (IC) sources.

Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Intelligent Systems Center
Comments

National Science Foundation, Grant IIP-1916535

Keywords and Phrases
  • Blind Source Separation (BSS),
  • Electromagnetic Interference (EMI),
  • Modulated Signals,
  • Near Field Scan (NFS),
  • Phase Resolving,
  • Random Fields
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2020 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
5-25-2020
Publication Date
25 May 2020
Citation Information
Yuanzhuo Liu, Jiangshuai Li, Chulsoon Hwang and Victor Khilkevich. "Near-Field Scan of Multiple Noncorrelated Sources using Blind Source Separation" IEEE Transactions on Electromagnetic Compatibility Vol. 62 Iss. 4 (2020) p. 1376 - 1385 ISSN: 0018-9375; 1558-187X
Available at: http://works.bepress.com/victor-khilkevich/69/