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Article
Growth of Bi thin films on quasicrystal surfaces
Physical Review B
  • H. R. Sharma, National Institute for Materials Science
  • V. Fournée, Ecole des Mines
  • M. Shimoda, National Institute for Materials Science
  • A. R. Ross, Iowa State University
  • Thomas A. Lograsso, Iowa State University
  • P. Gille, Ludwig-Maximilians-Universität München
  • A. P. Tsai, Tohoku University
Document Type
Article
Publication Date
10-14-2008
DOI
10.1103/PhysRevB.78.155416
Abstract
We present a comprehensive study of Bi thin-film growth on quasicrystal surfaces. The substrates used for the growth are the fivefold surface of icosahedral (i)-Al-Cu-Fe and i-Al-Pd-Mn and the tenfold surface of decagonal (d)-Al-Ni-Co quasicrystals. The growth is investigated at 300 and 525 K substrate temperatures and at different coverage (θ) ranging from submonolayer to ten monolayers. The film is characterized by scanning tunneling microscopy, reflection high-energy electron diffraction, and x-ray photoelectron spectroscopy. At 300 K, the deposited Bi yields a quasicrystalline film for θ≤1. For 1<θ<5, it forms nanocrystallites with (100) surface orientation. The islands have magic heights, which correspond to the stacking of four atomic layers (predominantly). The selection of magic heights is interpreted in terms of quantum size effects arising from the electron confinement within the film thickness. The islands establish rotational epitaxial relationship with the substrate. For higher coverage, the film grows with monatomic height, not with magic heights, and reflects the symmetry of the bulk Bi. When deposition is performed at 525 K, terrace diffusion is more effective, resulting in the aggregation of Bi adatoms developing into a smooth monolayer with quasiperiodic order. At this temperature, multilayers do not adsorb.
Comments

This article is from Physical Review B 78 (2008): 155416, doi:10.1103/PhysRevB.78.155416.

Copyright Owner
American Physical Society
Language
en
File Format
application/pdf
Citation Information
H. R. Sharma, V. Fournée, M. Shimoda, A. R. Ross, et al.. "Growth of Bi thin films on quasicrystal surfaces" Physical Review B Vol. 78 Iss. 15 (2008) p. 155416
Available at: http://works.bepress.com/thomas_lograsso/51/