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Presentation
Morphology of Sn Films Grown on the Fivefold Surface of Icosahedral Al63Cu24Fe13 Investigated by Scanning Tunneling Microscopy
Ames Laboratory Conference Papers, Posters, and Presentations
  • H. R. Sharma, Japan Science and Technology Agency
  • M. Shimoda, National Institute for Materials Science
  • J. A. Barrow, Iowa State University
  • Amy R. Ross, Iowa State University
  • Thomas A. Lograsso, Iowa State University
  • A. P. Tsai, Tohoku University
Document Type
Conference Proceeding
Conference
Symposium LL - Quasicrystals
Publication Date
1-1-2004
DOI
1557/PROC-805-LL7.11
Geolocation
(40.65320759999999, -80.07949250000001)
Abstract

Sn film growth on the fivefold surface of icosahedral Al63Cu24Fe13 has been investigated by employing scanning tunneling microscopy. For about monolayer coverage, the deposited Sn forms a layer of monoatomic height. A Fourier transform of the layer's structure reveals quasicrystalline long range order. At higher coverage, flat-topped clusters of uniform heights are formed. The clusters preferentially grow at the step edges.

Comments

This article is from MRS Proceedings 805 (2003): LL7.11, doi:10.1557/PROC-805-LL7.11.

Copyright Owner
Materials Research Society
Language
en
Citation Information
H. R. Sharma, M. Shimoda, J. A. Barrow, Amy R. Ross, et al.. "Morphology of Sn Films Grown on the Fivefold Surface of Icosahedral Al63Cu24Fe13 Investigated by Scanning Tunneling Microscopy" Warrendale, PA(2004)
Available at: http://works.bepress.com/thomas_lograsso/176/