Pseudomorphic Growth of a Single Element Quasiperiodic Ultrathin Film on a Quasicrystal SubstratePhysical Review Letters
AbstractAn ultrathin film with a periodic interlayer spacing was grown by the deposition of Cu atoms on the fivefold surface of the icosahedral Al70Pd21Mn9 quasicrystal. For coverages from 5 to 25 monolayers, a distinctive quasiperiodic low-energy electron diffraction pattern is observed. Scanning tunneling microscopy images show that the in-plane structure comprises rows having separations of S=4.5±0.2 Å and L=7.3±0.3 Å, whose ratio equals τ=1.618… within experimental error. The sequences of such row separations form segments of terms of the Fibonacci sequence, indicative of the formation of a pseudomorphic Cu film.
Copyright OwnerAmerican Physical Society
Citation InformationJ. Ledieu, J. T. Hoeft, D. E. Reid, J. A. Smerdon, et al.. "Pseudomorphic Growth of a Single Element Quasiperiodic Ultrathin Film on a Quasicrystal Substrate" Physical Review Letters Vol. 92 Iss. 13 (2004) p. 135507
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