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Article
Pseudomorphic Growth of a Single Element Quasiperiodic Ultrathin Film on a Quasicrystal Substrate
Physical Review Letters
Document Type
Article
Disciplines
Publication Date
4-2-2004
DOI
10.1103/PhysRevLett.92.135507
Abstract
An ultrathin film with a periodic interlayer spacing was grown by the deposition of Cu atoms on the fivefold surface of the icosahedral Al70Pd21Mn9 quasicrystal. For coverages from 5 to 25 monolayers, a distinctive quasiperiodic low-energy electron diffraction pattern is observed. Scanning tunneling microscopy images show that the in-plane structure comprises rows having separations of S=4.5±0.2 Å and L=7.3±0.3 Å, whose ratio equals τ=1.618… within experimental error. The sequences of such row separations form segments of terms of the Fibonacci sequence, indicative of the formation of a pseudomorphic Cu film.
Copyright Owner
American Physical Society
Copyright Date
2004
Language
en
File Format
application/pdf
Citation Information
J. Ledieu, J. T. Hoeft, D. E. Reid, J. A. Smerdon, et al.. "Pseudomorphic Growth of a Single Element Quasiperiodic Ultrathin Film on a Quasicrystal Substrate" Physical Review Letters Vol. 92 Iss. 13 (2004) p. 135507 Available at: http://works.bepress.com/thomas_lograsso/16/
This article is from Physical Review Letters 92 (2004): 135507, doi:10.1103/PhysRevLett.92.135507.