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Article
Reflectance anisotropy of Gd5Si2Ge2 and Tb5Si2.2Ge1.8
Applied Physics Letters
  • S. J. Lee, Iowa State University
  • Joong Mok Park, Iowa State University
  • J. E. Snyder, Iowa State University
  • David C. Jiles, Iowa State University
  • Deborah L. Schlagel, Iowa State University
  • Thomas A. Lograsso, Iowa State University
  • A. O. Pecharsky, Iowa State University
  • David W. Lynch, Iowa State University
Document Type
Article
Publication Date
3-15-2004
DOI
10.1063/1.1687463
Abstract

Reflectance difference (RD) spectra for the ab plane of the single crystals of Gd5Si2Ge2and bc planes of Gd5Si2Ge2 and Tb5Si2.2Ge1.8 were obtained in the photon energy range of 1.5–5.5 eV. Several peaks were observed for these crystals in the measured spectrum range. Similar features were observed in the RD spectra for the bc planes ofGd5Si2Ge2 and Tb5Si2.2Ge1.8, while different features were observed for the ab plane and bc plane of Gd5Si2Ge2. The RD spectra for the crystals arise not only from the surface anisotropy but also from the bulk anisotropy due to the monoclinic structure of the bulk crystal.

Comments

The following article appeared in Applied Physics Letters 84 (2004): 1865 and may be found at http://dx.doi.org/10.1063/1.1687463.

Rights
Copyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Copyright Owner
American Institute of Physics
Language
en
Date Available
2013-09-25
File Format
application/pdf
Citation Information
S. J. Lee, Joong Mok Park, J. E. Snyder, David C. Jiles, et al.. "Reflectance anisotropy of Gd5Si2Ge2 and Tb5Si2.2Ge1.8" Applied Physics Letters Vol. 84 Iss. 11 (2004) p. 1865 - 1867
Available at: http://works.bepress.com/thomas_lograsso/142/