Skip to main content
Article
An Expert System Approach to EMC Modeling
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (1996, Santa Clara, CA)
  • Todd H. Hubing, Missouri University of Science and Technology
  • James L. Drewniak, Missouri University of Science and Technology
  • Thomas Van Doren, Missouri University of Science and Technology
  • Navin Kashyap
Abstract

Existing computer software for EMC analysis can be divided into three categories. Analytical modeling codes employ closed form expressions to solve problems of general interest to EMC engineers or circuit designers. Numerical modeling codes use numerical techniques to solve Maxwell's equations subject to specific boundary conditions. EMC rule checkers search a design for features that violate basic EMC design guidelines. This paper outlines the relative advantages and limitations of each of these three approaches and describes an expert system EMC modeling approach. The new approach combines analytical models, numerical models, and EMC rule-checking in order to evaluate designs in much the same way that an EMC expert would.

Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (1996: Aug. 19-23, Santa Clara, CA)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • EMC Modeling,
  • EMC Rule Checkers,
  • Maxwell Equations,
  • Maxwell's Equations,
  • Analytical Modeling Codes,
  • Boundary Condition,
  • Closed Form Expressions,
  • Design,
  • Electrical Engineering Computing,
  • Electromagnetic Compatibility,
  • Expert System,
  • Expert Systems,
  • Numerical Analysis,
  • Numerical Modeling Codes,
  • Search,
  • Search Problems,
  • Boundary Conditions,
  • Computer Software,
  • Crosstalk,
  • Electromagnetic Wave Interference,
  • Finite Element Method,
  • Mathematical Models,
  • Numerical Methods,
  • Computer Modeling Codes,
  • Finite Difference Time Domain Codes
International Standard Book Number (ISBN)
780332075
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 1996 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-1996
Publication Date
01 Aug 1996
Citation Information
Todd H. Hubing, James L. Drewniak, Thomas Van Doren and Navin Kashyap. "An Expert System Approach to EMC Modeling" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (1996, Santa Clara, CA) (1996) p. 200 - 203 ISSN: 0190-1494
Available at: http://works.bepress.com/thomas-vandoren/9/