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FDTD and FEM/MOM Modeling of EMI Resulting from a Trace Near a PCB Edge
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.)
  • Daniel P. Berg
  • Motoshi Tanaka
  • Yun Ji
  • Xiaoning Ye
  • James L. Drewniak, Missouri University of Science and Technology
  • Todd H. Hubing, Missouri University of Science and Technology
  • Richard E. DuBroff, Missouri University of Science and Technology
  • Thomas Van Doren, Missouri University of Science and Technology
Abstract

PCB traces routed near board edges and carrying high-speed signals are considered to contribute to EMI problems. Consequently, design maxims state that traces that might have intentional or unintentional high frequency components on them be kept away from board edges. This costs valuable surface area as boards become more densely designed. Further, design maxims concerning traces near board edges are not well quantified. The increase in EMI as a trace is routed increasingly closer to the PCB edge has been studied experimentally and with numerical modeling.

Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2000: Aug. 21-25, Washington, DC)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • EMI Problems,
  • FDTD Modeling,
  • FEM/MOM Modeling,
  • PCB Edge,
  • PCB Layout,
  • PCB Traces,
  • Design Maxims,
  • Electromagnetic Interference,
  • Experiment,
  • Finite Difference Time-Domain Analysis,
  • Finite Element Analysis,
  • High Frequency Components,
  • High-Speed Signals,
  • Method of Moments,
  • Numerical Modeling,
  • Printed Circuit Design,
  • Printed Circuit Layout,
  • Trace Routing
International Standard Book Number (ISBN)
780356772
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2000 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2000
Publication Date
01 Aug 2000
Citation Information
Daniel P. Berg, Motoshi Tanaka, Yun Ji, Xiaoning Ye, et al.. "FDTD and FEM/MOM Modeling of EMI Resulting from a Trace Near a PCB Edge" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.) Vol. 1 (2000) p. 135 - 140 ISSN: 0190-1494
Available at: http://works.bepress.com/thomas-vandoren/56/