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The EMI Benefits of Ground Plane Stitching in Multi-Layer Power Bus Stacks
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.)
  • Xiaoning Ye
  • David M. Hockanson
  • Min Li
  • Wei Cui
  • S. Radu
  • James L. Drewniak, Missouri University of Science and Technology
  • Thomas Van Doren, Missouri University of Science and Technology
  • Todd H. Hubing, Missouri University of Science and Technology
  • Richard E. DuBroff, Missouri University of Science and Technology
Abstract

The effect on EMI of stitching multiple ground planes together along the periphery of multi-layer PCB stacks is studied. Power bus noise induced EMI and radiation from the board edges is the major concern herein. The EMI at 3 meters for different via stitch spacing and layer thickness is modeled with FDTD modeling. It is shown that the ground plane stitching effectively reduces the radiated EMI that results from fringing fields at the power bus edges. Two families of curves are generated to demonstrate the variation of the radiated EMI as a function of layer thickness and stitch spacing. Further studies show that the reduction of the EMI from ground plane stitching may be compromised by other radiation mechanisms.

Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2000: Aug. 21-25, Washington, DC)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • EMI Benefits,
  • FDTD Modeling,
  • Board Edges,
  • Earthing,
  • Electromagnetic Interference,
  • Finite Difference Time-Domain Analysis,
  • Fringing Fields,
  • Ground Plane Stitching,
  • Layer Thickness,
  • Multi-Layer PCB Stacks,
  • Multi-Layer Power Bus Stacks,
  • Noise,
  • Power Bus Noise,
  • Printed Circuit Boards,
  • Printed Circuits,
  • Radiated EMI Reduction,
  • Stitch Spacing
International Standard Book Number (ISBN)
780356772
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2000 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2000
Publication Date
01 Aug 2000
Citation Information
Xiaoning Ye, David M. Hockanson, Min Li, Wei Cui, et al.. "The EMI Benefits of Ground Plane Stitching in Multi-Layer Power Bus Stacks" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.) Vol. 2 (2000) p. 833 - 838 ISSN: 0190-1494
Available at: http://works.bepress.com/thomas-vandoren/5/