Article
Experimental and Numerical Study of the Radiation from Microstrip Bends
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.)
Abstract
This paper investigates the radiation from microstrip lines with 90-degree bends. A 1-GHz TEM cell is used to measure the radiation from microstrip lines with different kinds of bends. A full wave hybrid FEM/MoM code is used to compute the radiation. Both experimental and numerical results show that there is no significant difference between the radiation from right angle bends and bends with two 45-degree corners at frequencies and trace dimensions that are likely to be found on printed circuit boards.
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2000: Aug. 21-25, Washington, DC)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
- 1 GHz,
- 45-Degree Corners,
- 90-Degree Bends,
- EMI,
- TEM Cell,
- UHF,
- Electromagnetic Interference,
- Experimental Study,
- Finite Element Analysis,
- Full Wave Hybrid FEM/MoM Code,
- Method of Moments,
- Microstrip Bends Radiation,
- Microstrip Lines,
- Numerical Study,
- Printed Circuit Boards,
- Printed Circuit Layout,
- Right Angle Bends,
- Test Facilities,
- Trace Dimensions,
- Electromagnetic Wave Emission,
- Electromagnetic Waves,
- Finite Difference Method,
- Signal Distortion,
- Time Domain Analysis,
- Microstrip Bends
International Standard Book Number (ISBN)
780356772
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2000 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2000
Publication Date
01 Aug 2000
Disciplines
Citation Information
H. Wang, Yun Ji, Todd H. Hubing, James L. Drewniak, et al.. "Experimental and Numerical Study of the Radiation from Microstrip Bends" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.) Vol. 2 (2000) p. 739 - 741 ISSN: 0190-1494 Available at: http://works.bepress.com/thomas-vandoren/49/