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Article
Effects of Gapped Groundplanes and Guard Traces on Radiated EMI
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (1997, Austin, TX)
  • D. S Britt
  • David M. Hockanson
  • Fei Sha
  • James L. Drewniak, Missouri University of Science and Technology
  • Todd H. Hubing, Missouri University of Science and Technology
  • Thomas Van Doren, Missouri University of Science and Technology
Abstract

Designers sometimes employ gapped reference planes to isolate analog and digital signals, and separate "quiet" and "noisy" ground structures by providing a series impedance. Guard traces are also used to reduce unwanted coupling to adjacent traces, which can lead to signal integrity or EMI problems. This study investigates the impact of gaps and guard traces on radiated EMI. A simple microstrip circuit was constructed to experimentally analyze the effects of groundplane gaps and guard traces.

Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (1997: Aug. 18-22, Austin, TX)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • Electromagnetic Compatibility,
  • Electromagnetic Interference,
  • Gapped Groundplanes,
  • Gapped Reference Planes,
  • Ground Structures,
  • Guard Traces,
  • Microstrip Circuit,
  • Microstrip Circuits,
  • Radiated EMI,
  • Series Impedance,
  • Signal Integrity,
  • Inductance,
  • Impedance,
  • Circuit Noise,
  • Coupling Circuits,
  • Wrapping,
  • Laboratories,
  • Signal Design,
  • Microstrip Components
International Standard Book Number (ISBN)
780341406
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 1997 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-1997
Publication Date
01 Aug 1997
Citation Information
D. S Britt, David M. Hockanson, Fei Sha, James L. Drewniak, et al.. "Effects of Gapped Groundplanes and Guard Traces on Radiated EMI" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (1997, Austin, TX) (1997) p. 159 - 164 ISSN: 0190-1494
Available at: http://works.bepress.com/thomas-vandoren/41/