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Synthesis and Characterization of Aluminum-polyaniline Thin Films and Membranes
Surface and Interface Analysis
  • Yan Liu
  • Matthew O'Keefe, Missouri University of Science and Technology
  • Ayse Beyaz
  • Thomas P. Schuman, Missouri University of Science and Technology
Abstract

Polyaniline (PAni) films of different intrinsic oxidation states, including emeraldine salt, emeraldine base and leucoemeraldine base, were synthesized. Free-standing membranes and thin film bilayers of aluminum-polyaniline were fabricated by magnetron sputter deposition of aluminum onto polyaniline films. Aluminum-polyaniline samples were analyzed by transmission electron microscopy (TEM) to investigate the microstructures of specimens, including cross-sectional TEM micrographs of the metal-polyaniline interfacial structure not previously reported in the literature. Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) were employed to study the chemical bonding and interaction between deposited aluminum and polyaniline at the interface. Results indicated that the intrinsic oxidation state of the polyaniline influenced the chemistry of the aluminum-polyaniline interface. Distinct interaction between aluminum and polyaniline in the emeraldine salt-form was observed. However, there was no evidence of direct interactions of the aluminum with emeraldine base and leucoemeraldine base polyaniline.

Department(s)
Materials Science and Engineering
Second Department
Chemistry
Sponsor(s)
United States. Defense Advanced Research Projects Agency
Keywords and Phrases
  • TEM,
  • XPS,
  • Aluminum-Polyaniline,
  • Interface,
  • Microstructure,
  • Sputter Deposition
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2005 Wiley-Blackwell, All rights reserved.
Publication Date
10-1-2005
Citation Information
Yan Liu, Matthew O'Keefe, Ayse Beyaz and Thomas P. Schuman. "Synthesis and Characterization of Aluminum-polyaniline Thin Films and Membranes" Surface and Interface Analysis (2005) ISSN: 0142-2421
Available at: http://works.bepress.com/thomas-schuman/63/