About Tali Freed
Conference Proceedings (3)
The Benefits of Automatic Data Collection in the Fresh Produce ...
Proceedings of the 3rd Annual IEEE Conference on Automation Science and Engineering: Scottsdale, AZ (2007)
The potential for RFID based systems to improve the safety and efficiency of a supply chain with rapidly decaying products ...
A Taxonomy of Scheduling Problems in Semiconductor Device Test Operations
Proceedings of the International Conference on Modeling and Analysis of Semiconductor Manufacturing (2002)
Semiconductor device test facilities differ not only by production volume and tester brands. The complexity of the devices and the ...