A neurostimulator was investigated in this paper posthumously. Device was presented to our anatomical gift program. Investigation was multi-fold and contained visual inspection, using an optical microscope, and mechanical and electrical testing of leads and its insulator. It was concluded that the device could have been damaged during implantation, in vivo, during removal, and/or during transportation to author’s laboratories. The damage observed on the lead insulation is similar to that which can occur due to anchoring of the lead and hardening due to oxidation. Insulation stiffness was determined to be 1/10 of new insulator. The results reported here on the insulation may or may not have affected the electrical operation of the neurostimulator.