"Using Slow Measurement Systems to Measure Fast Excited‐State Kinetics with Nonlinear Rate‐ Competitive Optical Bleaching" by Stephen E. Bialkowski

Article

Using Slow Measurement Systems to Measure Fast Excited‐State Kinetics with Nonlinear Rate‐ Competitive Optical Bleaching

AIP Conference Proceedings: Photoacoustic and Photothermal Phenomena

Stephen E. Bialkowski, Utah State University
Agnes Chartier

Document Type

Article

Publication Date

1-1-1999

Editor

F. Scudieri and M. Bertolotti

Disciplines

Chemistry

Citation Information

Using Slow Measurement Systems to Measure Fast Excited‐State Kinetics with Nonlinear Rate‐ Competitive Optical Bleaching Stephen E. Bialkowski and Agnès Chartier Photoacoustic and Photothermal Phenomena, F. Scudieri and M. Bertolotti, Ed. AIP Conference Proceedings 463 14‐17 1999