Article
Method to Generate Surfaces with Desired Roughness Parameters
Langmuir
Document Type
Article
Disciplines
Publication Date
7-31-2007
DOI
10.1021/la063346h
Abstract
A surface engineering method based on the electrostatic deposition of microparticles and dry etching is described and shown to be able to independently tune both amplitude and spatial roughness parameters of the final surface. Statistical models were developed to connect process variables to the amplitude parameters (center line average and root-mean-square) and a spatial parameter (autocorrelation length) of the final surfaces. Process variables include particle coverage, which affects both amplitude and spatial roughness parameters, particle size, which affects only spatial parameters, and etch depth, which affects only amplitude parameters. Correlations between experimental data and model predictions are discussed.
Copyright Owner
American Chemical Society
Copyright Date
2007
Language
en
File Format
application/pdf
Citation Information
Yilei Zhang and Sriram Sundararajan. "Method to Generate Surfaces with Desired Roughness Parameters" Langmuir Vol. 23 Iss. 16 (2007) p. 8347 - 8351 Available at: http://works.bepress.com/sriram_sundararajan/9/
Reprinted with permission from Langmuir 23 (2007): 8347–831, doi:10.1021/la063346h. Copyright 2007 American Chemical Society.