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Article
Atom Scale Characterization of the Near Apex Region of an Atomic Force Microscope Tip
Microscopy and Microanalysis
  • Christopher J. Tourek, Iowa State University
  • Sriram Sundararajan, Iowa State University
Document Type
Article
Publication Date
10-1-2010
DOI
10.1017/S1431927610000437
Abstract

Three-dimensional atom probe tomography (APT) is successfully used to analyze the near-apex regions of an atomic force microscope (AFM) tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented. Comparison of the thin film data with that observed using transmission electron microscopy indicates that APT can be reliably used to investigate the material structure and chemistry of the apex of an AFM tip at near atomic scales.

Comments

This article is from Microscopy and Microanalysis 16 (2010): 636–642, doi:10.1017/S1431927610000437. Posted with permission.

Copyright Owner
Microscopy Society of America
Language
en
Date Available
2014-03-10
File Format
application/pdf
Citation Information
Christopher J. Tourek and Sriram Sundararajan. "Atom Scale Characterization of the Near Apex Region of an Atomic Force Microscope Tip" Microscopy and Microanalysis Vol. 16 Iss. 5 (2010) p. 636 - 642
Available at: http://works.bepress.com/sriram_sundararajan/7/