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Article
Identification, Characterization, and Implications of Shadow Degradation in Thin Film Solar Cells
2011 IEEE International Reliability Physics Symposium (IRPS)
  • Sourabh Dongaonkar, Purdue University - Main Campus
  • Karthik Y, Indian Institute of Technology - Bombay
  • Dapeng Wang
  • Michel Frei
  • Souvik Mahapatra, Indian Institute of Technology - Bombay
  • Muhammad A. Alam, Network for Computational Nanotechnoloy, Birck Nanotechnology Center, School of Electrical and Computer Engineering, Purdue University
Abstract

We describe a comprehensive study of intrinsicreliability issue arising from partial shadowing of photovoltaicpanels (e.g., a leaf fallen on it, a nearby tree casting a shadow,etc.). This can cause the shaded cells to be reverse biased, causingdark current degradation. In this paper, (1) we calculate thestatistical distribution of reverse bias stress arising from variousshading configurations, (2) identify the components of darkcurrent, and provide a scheme to isolate them, (3) characterizethe effect of reverse stress on the dark current of a-Si:H p-i-ncells, and (4) finally, combine these features of degradationprocess with shadowing statistics, to project ‘shadow-degradation’ (SD) over the operating lifetime of solar cells. Ourresults establish shadow degradation as an important intrinsicreliability concern for thin film solar cell.

Keywords
  • Thin film solar cells,
  • performance degradation,
  • reliability,
  • voltage stress
Date of this Version
1-1-2011
DOI
10.1109/IRPS.2011.5784535
Citation
Dongaonkar, S.; Alam, M.A.; Karthik, Y.; Mahapatra, S.; Dapeng Wang; Frei, M.; , "Identification, characterization, and implications of shadow degradation in thin film solar cells," Reliability Physics Symposium (IRPS), 2011 IEEE International , vol., no., pp.5E.4.1-5E.4.5, 10-14 April 2011
Citation Information
Sourabh Dongaonkar, Karthik Y, Dapeng Wang, Michel Frei, et al.. "Identification, Characterization, and Implications of Shadow Degradation in Thin Film Solar Cells" 2011 IEEE International Reliability Physics Symposium (IRPS) (2011)
Available at: http://works.bepress.com/sourabh_dongaonkar/3/