Article
Three-dimensional shape measurement with binary dithered patterns
Applied Optics
Document Type
Article
Disciplines
Publication Date
9-20-2012
DOI
10.1364/AO.51.006631
Abstract
The previously proposed binary defocusing technique and its variations have proven successful for high-quality three-dimensional (3D) shape measurement when fringe stripes are relatively narrow, but they suffer if fringe stripes are wide. This paper proposes to utilize the binary dithering technique to conquer this challenge. Both simulation and experimental results show the phase error is always less than 0.6% even when the fringe stripes are wide and the projector is nearly focused.
Rights
This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.51.006631. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Copyright Owner
Optical Society of America
Copyright Date
2012
Language
en
File Format
application/pdf
Citation Information
Yajun Wang and Song Zhang. "Three-dimensional shape measurement with binary dithered patterns" Applied Optics Vol. 51 Iss. 27 (2012) p. 6631 - 6636 Available at: http://works.bepress.com/song_zhang/20/
This article is from Applied Optics 51 (2012): 6631–6636, doi:10.1364/AO.51.006631. Posted with permission.