Article
High-resolution 3D profilometry with binary phase-shifting methods
Applied Optics
Document Type
Article
Disciplines
Publication Date
4-20-2011
DOI
10.1364/AO.50.001753
Abstract
This paper presents a novel pixel-level resolution 3D profilometry technique that only needs binary phase-shifted structured patterns. This technique uses four sets of three phase-shifted binary patterns to achieve the phase error of less than 0.2%, and only requires two sets to reach similar quality if the projector is slightly defocused. Theoretical analysis, simulations, and experiments will be presented to verify the performance of the proposed technique.
Rights
This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.50.001753. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Copyright Owner
Optical Society of America
Copyright Date
2011
Language
en
File Format
application/pdf
Citation Information
Song Zhang. "High-resolution 3D profilometry with binary phase-shifting methods" Applied Optics Vol. 50 Iss. 12 (2011) p. 1753 - 1757 Available at: http://works.bepress.com/song_zhang/10/
This article is from Applied Optics 50 (2011): 1753–1757, doi:10.1364/AO.50.001753. Posted with permission.