Article
Ultrafast 3-D shape measurement with an off-the-shelf DLP projector
Optics Express
Document Type
Article
Disciplines
Publication Date
9-13-2010
DOI
10.1364/OE.18.019743
Abstract
This paper presents a technique that reaches 3-D shape measurement speed beyond the digital-light-processing (DLP) projector’s projection speed. In particular, a “solid-state” binary structured pattern is generated with each micro-mirror pixel always being at one status (ON or OFF). By this means, any time segment of projection can represent the whole signal, thus the exposure time can be shorter than the projection time. A sinusoidal fringe pattern is generated by properly defocusing a binary one, and the Fourier fringe analysis means is used for 3-D shape recovery. We have successfully reached 4,000 Hz rate (80 µs exposure time) 3-D shape measurement speed with an off-the-shelf DLP projector.
Rights
This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.18.019743. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Copyright Owner
Optical Society of America
Copyright Date
2010
Language
en
File Format
application/pdf
Citation Information
Yuanzheng Gong and Song Zhang. "Ultrafast 3-D shape measurement with an off-the-shelf DLP projector" Optics Express Vol. 18 Iss. 19 (2010) p. 19743 - 19754 Available at: http://works.bepress.com/song_zhang/1/
This article is from Optics Express 18 (2010): 19743–19754, doi:10.1364/OE.18.019743. Posted with permission.