Comparison of Contactless Measurement and Testing Techniques to a New All-Silicon Optical Test and Characterization Method2005
AbstractThe rapid improvement in performance and increased density of electronic devices in integrated circuits has provided a strong motivation for the development of contactless testing and diagnostic measurement methods. This paper first reviews existing contactless test methodologies and then compares these with an all-silicon contactless testing approach that has been recently developed and demonstrated. This cost-effective approach utilizes silicon-generated optical signals and has the advantages of easy test setup, low equipment cost, and noninvasiveness over existing contactless test and measurement methods.
Citation InformationSherra E. Kerns, David V. Kerns and Selahattin Sayil. "Comparison of Contactless Measurement and Testing Techniques to a New All-Silicon Optical Test and Characterization Method" (2005)
Available at: http://works.bepress.com/sherra_kerns/5/