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Article
Comparison of Contactless Measurement and Testing Techniques to a New All-Silicon Optical Test and Characterization Method
2005
  • Sherra E. Kerns, Franklin W. Olin College of Engineering
  • David V. Kerns, Franklin W. Olin College of Engineering
  • Selahattin Sayil, Lamar University
Document Type
Article
Publication Date
10-1-2005
Abstract
The rapid improvement in performance and increased density of electronic devices in integrated circuits has provided a strong motivation for the development of contactless testing and diagnostic measurement methods. This paper first reviews existing contactless test methodologies and then compares these with an all-silicon contactless testing approach that has been recently developed and demonstrated. This cost-effective approach utilizes silicon-generated optical signals and has the advantages of easy test setup, low equipment cost, and noninvasiveness over existing contactless test and measurement methods.
Comments

© 2005 Institute of Electrical and Electronics Engineers. This article was published in IEEE Transactions on Instrumentation and Measurement, vol. 54, iss. 5, p. 2082-2089 and may be found here.

Citation Information
Sherra E. Kerns, David V. Kerns and Selahattin Sayil. "Comparison of Contactless Measurement and Testing Techniques to a New All-Silicon Optical Test and Characterization Method" (2005)
Available at: http://works.bepress.com/sherra_kerns/5/