Presentation
Photoemission Electron Microscopy of Graphene
14th Annual Meeting of the Northwest Section of the APS
(2012)
Abstract
A study of chemical vapor deposited graphene on copper foil is conducted using an aberration-corrected photoemission electron microscope (PEEM). We demonstrate the efficacy such a PEEM has in identifying multi-layer graphene, defects and cracking. A model is developed to describe the observed reduction in photoemission rate where electrons originate from the copper foil and scatter through the graphene. A survey of several multi-layer feature line profiles demonstrates the reduced photoemission rate as the number of graphene layers increases. A mean-free-path length of l=3.8±0.8 nm is inferred assuming the layer spacing in graphene is Δz=0.35 nm. The PEEM's high spatial resolution and surface sensitivity combined with no electron beam damage are promising for characterizing biosensors and other nanoscale graphene devices.
Disciplines
Publication Date
October, 2012
Citation Information
Sebastian Saliba, Jenna Wardini, Joseph P.S. Fitzgerald, Robert Campbell Word, et al.. "Photoemission Electron Microscopy of Graphene" 14th Annual Meeting of the Northwest Section of the APS (2012) Available at: http://works.bepress.com/rolf_koenenkamp/22/