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Article
Photonic Near-Field Imaging in Multiphoton Photoemission Electron Microscopy
Physical Review B
  • Joseph Fitzgerald, Portland State University
  • Robert Campbell Word, Portland State University
  • S. D. Saliba, Portland State University
  • Rolf Kӧnenkamp, Portland State University
Document Type
Article
Publication Date
5-13-2013
Subjects
  • Multiphoton processes,
  • Multiphoton excitation microscopy,
  • Near-field microscopy
Disciplines
Abstract

We report the observation of optical near fields in a photonic waveguide of conductive indium tin oxide (ITO) using multiphoton photoemission electron microscopy (PEEM). Nonlinear two-photon photoelectron emission is enhanced at field maxima created by interference between incident 410-nm and coherently excited guided photonic waves, providing strong phase contrast. Guided modes are observed under both transverse magnetic field (TM) and transverse electric field (TE) polarized illuminations and are consistent with classical electromagnetic theory. Implications on the role of multiphoton PEEM in optical near-field imaging are discussed.

Description

Copyright 2013 American Physical Society. The original instance can be found at http://link.aps.org/doi/10.1103/PhysRevB.87.205419

DOI
10.1103/PhysRevB.87.205419
Persistent Identifier
http://archives.pdx.edu/ds/psu/9625
Citation Information
Fitzgerald, J. P. S., et al. "Photonic near-field imaging in multiphoton photoemission electron microscopy." Physical Review B 87.20 (2013): 205419.