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Article
Direct Imaging of Optical Diffraction in Photoemission Electron Microscopy
Applied Physics Letters
  • Robert Campbell Word, Portland State University
  • Joseph Fitzgerald, Portland State University
  • Rolf Kӧnenkamp, Portland State University
Document Type
Article
Publication Date
7-12-2013
Subjects
  • Optical diffraction,
  • Photoelectron spectroscopy,
  • Nanostructures,
  • Electric fields,
  • Wavelengths
Disciplines
Abstract
We report the visualization of optical diffraction at the boundaries of semiconductor and metal nanostructures in non-linear photoemission electron microscopy. We observe light diffracting into photonic and plasmonic modes of planar samples, and into photonic vacuum modes above sample surfaces. In either case, the electron photoemission rate from the sample material is spatially modulated resulting in photoemission images with information on the electric field distribution at the sample/vacuum interface. The resolution in these images is typically ∼30 nm, i.e., significantly below the wavelengths of the exciting light. Optical phase shifts and absorption losses for the diffracted modes can be determined.
Description

This is the publisher's final pdf. Article appears in Applied Physics Letters (http://apl.aip.org/) and is copyrighted 2013 by the American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

DOI
10.1063/1.4813550
Persistent Identifier
http://archives.pdx.edu/ds/psu/9933
Citation Information
Word, Robert C., J. P. S. Fitzgerald, and Rolf Konenkamp. "Direct imaging of optical diffraction in photoemission electron microscopy." Applied Physics Letters 103.2 (2013): 021118-021118.