Skip to main content
Article
Apparatus and method for transient thermal infrared emission spectrometry
Iowa State University Patents
  • John F. McClelland, Iowa State University
  • Roger W. Jones, Iowa State University
Document Type
Patent
Publication Date
12-24-1991
Abstract

A method and apparatus for enabling analysis of a solid material (16, 42) by applying energy from an energy source (20, 70) top a surface region of the solid material sufficient to cause transient heating in a thin surface layer portion of the solid material (16, 42) so as to enable transient thermal emission of infrared radiation from the thin surface layer portion, and by detecting with a spectrometer/detector (28, 58) substantially only the transient thermal emission of infrared radiation from the thin surface layer portion of the solid material. The detected transient thermal emission of infrared radiation is sufficiently free of self-absorption by the solid material of emitted infrared radiation, so as to be indicative of characteristics relating to molecular composition of the solid material.

Patent Number
US 5,075,552
ISURF Reference Number

1025

Assignee
Iowa State University Research Foundation, Inc.,
Application Number
US 07/576,448
Date Filed
1-12-1990
Language
en
Date Available
2013-09-27
File Format
application/pdf
Citation Information
John F. McClelland and Roger W. Jones. "Apparatus and method for transient thermal infrared emission spectrometry" (1991)
Available at: http://works.bepress.com/roger_jones/4/