Apparatus and method for transient thermal infrared emission spectrometryIowa State University Patents
AbstractA method and apparatus for enabling analysis of a solid material (16, 42) by applying energy from an energy source (20, 70) top a surface region of the solid material sufficient to cause transient heating in a thin surface layer portion of the solid material (16, 42) so as to enable transient thermal emission of infrared radiation from the thin surface layer portion, and by detecting with a spectrometer/detector (28, 58) substantially only the transient thermal emission of infrared radiation from the thin surface layer portion of the solid material. The detected transient thermal emission of infrared radiation is sufficiently free of self-absorption by the solid material of emitted infrared radiation, so as to be indicative of characteristics relating to molecular composition of the solid material.
Patent NumberUS 5,075,552
ISURF Reference Number
AssigneeIowa State University Research Foundation, Inc.,
Application NumberUS 07/576,448
Citation InformationJohn F. McClelland and Roger W. Jones. "Apparatus and method for transient thermal infrared emission spectrometry" (1991)
Available at: http://works.bepress.com/roger_jones/4/