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Article
Multivariate Pattern Matching of Trace Elements in Solids by Laser Ablation Inductively Coupled Plasma-Mass Spectrometry:  Source Attribution and Preliminary Diagnosis of Fractionation
Analytical Chemistry
  • David B. Aeschliman, Iowa State University
  • Stanley J. Bajic, Iowa State University
  • David P. Baldwin, Iowa State University
  • Robert S. Houk, Iowa State University
Document Type
Article
Publication Version
Published Version
Publication Date
5-5-2004
DOI
10.1021/ac0345042
Abstract

Laser ablation inductively coupled plasma mass spectrometry (LA-ICPMS) is used with two variations of principal components analysis (PCA) for objective, routine comparisons of forensic materials without time-consuming and destructive sample dissolution. The relative concentrations of trace elements in a solid sample are examined to provide a “fingerprint” composition that can be used for identification and source matching of the material. Residue samples are matched to bulk materials using PCA. Variation of laser focus and PCA are also used to diagnose the severity of elemental fractionation in two metal samples that are prone to fractionation, brass and steel. Such fractionation remains the most significant limitation for accurate quantitative analyses by LA-ICPMS.

Comments

Reprinted (adapted) with permission from Analytical Chemistry 76 (2004): 3119, doi: 10.1021/ac0345042. Copyright 2004 American Chemical Society.

Copyright Owner
American Chemical Society
Language
en
File Format
application/pdf
Citation Information
David B. Aeschliman, Stanley J. Bajic, David P. Baldwin and Robert S. Houk. "Multivariate Pattern Matching of Trace Elements in Solids by Laser Ablation Inductively Coupled Plasma-Mass Spectrometry:  Source Attribution and Preliminary Diagnosis of Fractionation" Analytical Chemistry Vol. 76 Iss. 11 (2004) p. 3119 - 3125
Available at: http://works.bepress.com/robert_houk/7/