Presentation
Patent Examination Policy and the Social Costs of Examiner Allowance and Rejection Errors
Stanford Technology Law Review Symposium
(2010)
Keywords
- Patent examination,
- Allowance Error,
- Rejection Error,
- Patent Quality,
- U.S. Patent Office,
- Social Costs,
- Patent Abolition,
- Patent Registration System
Disciplines
- Administrative Law,
- Applied Mathematics,
- Economic Policy,
- Economic Theory,
- Entrepreneurial and Small Business Operations,
- Intellectual Property Law,
- Law,
- Organizational Behavior and Theory,
- Science and Technology Law,
- Science and Technology Policy,
- Statistics and Probability and
- Technology and Innovation
Publication Date
February 26, 2010
Citation Information
Ron D. Katznelson, "Patent Examination Policy and the Social Costs of Examiner Allowance and Rejection Errors," Stanford Technology Law Review Symposium on PTO Reform, Stanford, CA. (Feb. 26, 2010). Available at: http://works.bepress.com/rkatznelson/61