R. Zoughi earned his B.S.E.E, M.S.E.E, and Ph.D. degrees in electrical engineering (radar remote sensing, radar systems, and microwaves) from the University of Kansas where from 1981 until 1987 he was at the Radar Systems and Remote Sensing Laboratory (RSL).  Currently he is the Schlumberger Endowed Professor of Electrical and Computer Engineering at Missouri University of Science and Technology (S&T) (formerly University of Missouri-Rolla).  Prior to joining Missouri S&T in January 2001 and since 1987 he was with the Electrical and Computer Engineering Department at Colorado State University (CSU), where he was a professor and established the Applied Microwave Nondestructive Testing Laboratory (amntl). Dr. Zoughi held the position of Business Challenge Endowed Professor of Electrical and Computer Engineering from 1995 to 1997 while at CSU.

He is the co-author of over 590 journal papers, conference proceedings and presentations and technical reports. He is the author of the book entitled “Microwave Nondestructive Testing and Evaluation Principles” KLUWER Academic Publishers, 2000, and the co-author of a chapter on Microwave Techniques in “Nondestructive Evaluation: Theory, Techniques, and Applications” Marcel and Dekker, Inc., 2002.

He has received numerous teaching awards at CSU, the Colorado State University Research Foundation recognized him as an “Honored Researcher” for seven years, and he received the 1992 Engineering Dean’s Council Award. Since at Missouri S&T, he has received the Outstanding Teaching, School of Engineering Teaching Excellence, Teaching Excellence, and Outstanding Teaching Commendation Awards for a combined sixteen times.

Dr. Zoughi has been very active professionally serving his profession in many different capacities over the years. He served as the Editor-in-Chief of the IEEE Transactions on Instrumentation and Measurement (2007-2011) and as the President of the IEEE Instrumentation and Measurement Society (2014-2015). Currently, he serves as the Society’s Jr. Past President and Chair of the Board (2016-2018) of the IEEE Instrumentation and Measurement Technology Conference (I2MTC). He is also a Distinguished Lecturer for the IEEE Instrumentation and Measurement Society. He serves as a Board Member for the IEEE Systems Journal and serves as a Technical Associate Editor for Materials Evaluation. He was also a member of the Editorial Board of Research in Nondestructive Testing (2002-2006).  He was a member of the Nondestructive Evaluation Workshop Organizing Panel (2007-2008), National Research Council, the National Academies, Washington, DC. He was the Guest Editor for the Special Issue on Microwave NDE for Research in Nondestructive Evaluation (RNDE) in 1995. He has served on the IEEE Technical Activities Board (TAB) Publications Services & Products Board (PSPB) (2015 & 2017), and was elected as an at-large IEEE PSPB member (2016-2018). He has also served on several different professional society boards and executive committees, including currently as a member of the NASA Engineering and Safety Center (NESC) NDE Technical Discipline Team (TDT).

He has been the Principal or Co-Principal Investigator on over one-hundred sponsored research grants, funded by various state and federal agencies, and commercial/industrial entities.  He has also been involved in twenty-five Educational and Fellowship Awards focused on training undergraduate and graduate students. Three of the awardees received the National Science Foundation (NSF) Graduate Fellowship and one has received the NASA Space Technology Research Fellowship.

He holds eighteen US patents (some are also awarded in other countries) with several others pending. He has delivered numerous Invited and Keynote presentations on the subject of microwave and millimeter wave nondestructive testing and imaging.

He is a Fellow (class of 2005) of the American Society for Nondestructive Testing (ASNT) and a Fellow (class of 2006) of the Institute of Electrical and Electronics Engineers (IEEE).