"Fault Coverage Measurement Technique for Analog Circuits" by E. Paul Ratazzi

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Fault Coverage Measurement Technique for Analog Circuits

Electrical Engineering and Computer Science - All Scholarship

E. Paul Ratazzi, Syracuse University

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Document Type

Report

Date

3-30-1992

Keywords

fault coverage,
analog circuits,
fault simulation,
fault dictionary

Language

English

Disciplines

Electrical and Computer Engineering and
Electrical and Electronics

Description/Abstract

This report describes an effort to develop a technique for measuring the amount of fault detection coverage that an analog test pattern has for a particular analog device. The technique is based on a software tool which statistically analyzes data from a circuit simulator. One example of a fault simulation experiment is presented, and some of the results are discussed. Finally, some ideas for future work in this area are given.

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harvest source

Citation Information

E. Paul Ratazzi. "Fault Coverage Measurement Technique for Analog Circuits" (1992)
Available at: http://works.bepress.com/ratazzi/1/