Article
In Situ Observation of Antisite Defect Formation during Crystal Growth
Physical Review Letters
Document Type
Article
Disciplines
Publication Date
12-10-2010
DOI
10.1103/PhysRevLett.105.245501
Abstract
In situ x-ray diffraction (XRD) coupled with molecular dynamics (MD) simulations have been used to quantify antisite defect trapping during crystallization. Rietveld refinement of the XRD data revealed a marked lattice distortion which involves an a axis expansion and a c axis contraction of the stable C11b phase. The observed lattice response is proportional in magnitude to the growth rate, suggesting that the behavior is associated with the kinetic trapping of lattice defects. MD simulations demonstrate that this lattice response is due to incorporation of 1% to 2% antisite defects during growth.
Copyright Owner
American Physical Society
Copyright Date
2010
Language
en
File Format
application/pdf
Citation Information
Matthew J. Kramer, Mikhail I. Mendelev and Ralph E. Napolitano. "In Situ Observation of Antisite Defect Formation during Crystal Growth" Physical Review Letters Vol. 105 (2010) p. 245501 Available at: http://works.bepress.com/ralph_napolitano/2/
This article is from Physical Review Letters 105 (2010): 245501, doi:10.1103/PhysRevLett.105.245501. Posted with permission.