Article
Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example
Applied Physics Letters
Document Type
Article
Disciplines
Publication Date
9-29-2008
DOI
10.1063/1.2990759
Abstract
A control approach to achieve nanoscale broadband viscoelasticmeasurement using scanning probe microscope(SPM) is reported. Current SPM-based force measurement is too slow to measure rate-dependent phenomena, and large (temporal) measurement errors can be generated when the sample itself changes rapidly. The recently developed model-less inversion-based iterative control technique is used to eliminate the dynamics and hysteresis effects of the SPM hardware on the measurements, enabling rapid excitation and measurement of rate-dependent material properties. The approach is illustrated by the mechanical characterization of poly(dimethylsiloxane) over a broad frequency range of three orders of magnitude (∼1 Hz to 4.5 KHz).
Rights
Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Copyright Owner
American Institute of Physics
Copyright Date
2008
Language
en
File Format
application/pdf
Citation Information
Zhonghua Xu, Kyongsoo Kim, Qingze Zou and Pranav Shrotriya. "Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example" Applied Physics Letters Vol. 93 Iss. 133103 (2008) p. 1 - 3 Available at: http://works.bepress.com/pranav_shrotriya/24/
The following article appeared in Applied Physics Letters 93, 133103 (2008); and may be found at, doi:10.1063/1.2990759.