Article
Performance Evaluation of Various Semiconductor Technologies for Automotive Applications
Proceedings of the 2013 28th Annual IEEE Applied Power Electronics Conference and Exposition (2013, Long Beach, CA)
Abstract
This paper evaluates the commercially available semiconductor switches for automotive applications. For this purpose, a conventional Silicon (Si) Insulated Gate Bipolar Transistor (IGBT) is compared with a Silicon Carbide (SiC) Metal Oxide Semiconductor Field Effect Transistor (MOSFET). Performance criteria for automotive drive systems are compared between the two switches. Electromagnetic interferences due to the switching times of the switches are studied. A test is performed to measure the actual power losses for both switches. Using the simulated model of the heatsink, the temperature of the junction for each switch is estimated. Afterwards, the results are compared with the data provided in the technical documents of the switches.
Meeting Name
2013 28th Annual IEEE Applied Power Electronics Conference and Exposition (APEC) (2013: Mar. 17-21, Long Beach, CA)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
- Automotive Applications,
- Drive Systems,
- Performance Criterion,
- Semiconductor Technology,
- Silicon Carbides (SiC),
- Simulated Model,
- Switching Time,
- Technical Documents,
- Automobiles,
- Computer Simulation,
- Digital Storage,
- Electromagnetic Pulse,
- Electron Beam Lithography,
- Insulated Gate Bipolar Transistors (IGBT),
- MOSFET Devices,
- Semiconductor Device Manufacture,
- Silicon Carbide,
- Power Electronics
International Standard Book Number (ISBN)
978-1467343541
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
3-1-2013
Publication Date
01 Mar 2013
Disciplines
Citation Information
Pourya Shamsi, Matthew McDonough, Amir Hossein Ranjbar and Babak Fahimi. "Performance Evaluation of Various Semiconductor Technologies for Automotive Applications" Proceedings of the 2013 28th Annual IEEE Applied Power Electronics Conference and Exposition (2013, Long Beach, CA) (2013) p. 3061 - 3066 ISSN: 1048-2334 Available at: http://works.bepress.com/pourya-shamsi/52/