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Article
Lattice Fringe Fingerprinting in Two Dimensions with Database Support
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
  • Peter Moeck, Portland State University
  • B. Seipel, Oregon Nanoscience and Microtechnologies Institute
  • R. Bjorge, Advisory Board of the Crystallography Open Database
  • P. Fraundorf, University of Missouri - St Louis
Document Type
Article
Publication Date
1-1-2006
Subjects
  • Transmission electron microscopy -- Technique,
  • Crystallography -- Databases,
  • Nanocrystals
Abstract
A brief introduction to lattice fringe fingerprinting in two dimensions (2D) with database support is given. The method is employed for the identification of the crystal phase of a small ensemble of nanocrystals. The enhanced viability of this method in aberration-corrected transmission electron microscopes (TEMs) and scanning TEMs (STEMs) is also illustrated.
Description

Originally presented at the 2006 NSTI Nanotechnology Conference and Trade Show and included in its technical proceedings. © Nano Science and Technology Institute

Version of record may be found at http://www.nsti.org/procs/Nanotech2006v1/8/W61.102.

Persistent Identifier
http://archives.pdx.edu/ds/psu/16071
Citation Information
Moeck, P., B. Seipel, R. Bjorge, and P. Fraundorf. "Lattice fringe fingerprinting in two dimensions with database support." In Proc. NSTI-Nanotech, vol. 1, pp. 741-744. 2006.