"Crystallite Thickness Estimates From Precession Electron Diffraction Patterns For Structural Fingerprinting In The Quasi-Kinematic Limit" by Peter Moeck

Article

Crystallite Thickness Estimates From Precession Electron Diffraction Patterns For Structural Fingerprinting In The Quasi-Kinematic Limit

Microscopy and Microanalysis

Peter Moeck, Portland State University
Jack C. Straton, Portland State University
Sergei Rouvimov, Portland State University
I. Haeusler, Humboldt University of Berlin,

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Document Type

Citation

Publication Date

7-1-2012

Disciplines

Physics

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Description

Locate the Document

https://doi.org/10.1017/S1431927612004667

DOI

10.1017/S1431927612004667

Persistent Identifier

https://archives.pdx.edu/ds/psu/25895

Citation Information

Moeck, P., Straton, J., Rouvimov, S., & Haeusler, I. (2012). Crystallite Thickness Estimates from Precession Electron Diffraction Patterns for Structural Fingerprinting in the Quasi-kinematic Limit. Microscopy and Microanalysis, 18(S2), 562-563.