Automated Nanocrystal Orientation and Phase Mapping in the Transmission Electron Microscope on the Basis of Precession Electron DiffractionZeitschrift für Kristallographie - Crystalline Materials
SponsorThe work at Portland State University was supported by grants from the Oregon Nanoscience and Microtechnologies Institute. Additional support from Portland State University’s Venture Development Fund is also acknowledged.
- Transmission electron microscopy,
- Electrons -- Diffraction,
- Orientation mapping
AbstractAn automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope is described. It is primarily based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. Precession electron diffraction patterns are especially useful for this purpose. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any older or newer mid-voltage transmission electron microscope (TEM). Experimentally obtained crystal phase and orientation maps are shown for a variety of samples. Comprehensive commercial and open-access crystallographic databases may be used in support of the nanocrystal phase identification process and are briefly mentioned.
Citation InformationRauch, Edgar F., et al. "Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction." Zeitschrift für Kristallographie International journal for structural, physical, and chemical aspects of crystalline materials 225.2-3 (2010): 103-109.