Article
Determining Projected Symmetries for Structural Fingerprinting of Nanocrystals
Microscopy and Microanalysis
(2009)
Keywords
- Crystals -- Symmetry,
- Nanocrystals -- Structure,
- Crystallography
Disciplines
Publication Date
July, 2009
Publisher Statement
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009.
Citation Information
Peter Moeck and Sergei Rouvimov. "Determining Projected Symmetries for Structural Fingerprinting of Nanocrystals" Microscopy and Microanalysis Vol. 15 Iss. Supplement S2 (2009) Available at: http://works.bepress.com/peter_moeck/52/