Skip to main content
Article
Atomic Structure of Ultra-Thin WSe2 Films Based on HRTEM Analysis
Microscopy and Microanalysis (2010)
  • S. Rouvimov, Portland State University
  • P. Plachinda, Portland State University
  • M. Beekman, University of Oregon
  • N. T. Nguyen, University of Oregon
  • D. Johnson, University of Oregon
  • Peter Moeck, Portland State University
  • E. F. Rauch
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Keywords
  • Thin films -- Atomic structure,
  • Tungsten diselenide,
  • Transmission electron microscopy
Disciplines
Publication Date
July, 2010
Publisher Statement
Copyright © Microscopy Society of America 2010
Citation Information
S. Rouvimov, P. Plachinda, M. Beekman, N. T. Nguyen, et al.. "Atomic Structure of Ultra-Thin WSe2 Films Based on HRTEM Analysis" Microscopy and Microanalysis Vol. 16 Iss. Supplement S2 (2010)
Available at: http://works.bepress.com/peter_moeck/46/